Band offsets at amorphous hydrogenated boron nitride/high-k oxide interfaces from x-ray photoelectron spectroscopy with charging effects analysis

Michelle M. Paquette,Anthony N. Caruso,Justin Brockman,Jeff Bielefeld,Markus Kuhn,Sean W. King

Band offsets at amorphous hydrogenated boron nitride/high-k oxide interfaces from x-ray photoelectron spectroscopy with charging effects analysis

2020

Michelle M. Paquette
Anthony N. Caruso
Justin Brockman
Jeff Bielefeld
Markus Kuhn
Sean W. King

To facilitate the design of heterostructure devices employing hexagonal (sp2) boron nitride, x-ray photoelectron spectroscopy has been used to determine the valence band offsets (VBOs) at interface...

Keywords:

Oxide
Amorphous solid
Boron nitride
Chemistry
X-ray photoelectron spectroscopy
High-κ dielectric
Analytical chemistry
Hexagonal crystal system
Heterojunction
Valence band
Materials science

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