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Power, Performance and Area Analysis of Source/Drain Patterning n/p FinFETs based 6T-SRAM cell for 3-nm technology node
Power, Performance and Area Analysis of Source/Drain Patterning n/p FinFETs based 6T-SRAM cell for 3-nm technology node
2020
Rock-Hyun Baek
Junjong Lee
Lee Seunghwan
Jeong Jinsu
Jun-Sik Yoon
Keywords:
Optoelectronics
sram cell
power performance
Materials science
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