Measurement of Anomalous Hall Effect in Reentrant Spin Glass Ni(Pt)Mn Thin Film

The anomalous Hall resistivity ρ x y and the magnetization M of a reentrant spin glass Ni(Pt)Mn thin film were simultaneously measured as a function of temperature in fields from 1000 to 9000 Oe. The value of ρ x y / M depends on the cooling condition at temperatures below the spin glass transition temperature T g and the low-field value of ρ x y / M shows a cusp like peak around T g in the zero field cooled (ZFC) condition. The anomaly in the ZFC data can be explained in terms of the contribution to the anomalous Hall effect from chirality mechanism.