Low-energy electron current image diffraction (CID) of the basal plane of titanium

Abstract The basal plane of titanium has been studied by low-energy electron current image diffraction. Using a simple model, the average inner potential and surface interlayer distance were deduced from Bragg scattering features in the diffraction patterns which were obtained from a series of photographs of crystal surface images obtained at various primary beam energies. Computed geometric changes of Bragg scattering as a function of angle of incidence are presented for the energy range 0–200 eV. It is suggested that an energy monochromator incorporated in the electron gun would improve the pattern resolution and bring out energy sensitive lines which are not observed under the present conditions. Image enhancement methods would also increase the precision of the measurements.