Practical Evaluation of Optocouplers TID-Hardness Research Method Using an X-ray Unit

S. V. Novikov,M. E. Cherniak,R.K. Mozhaev,Dmitry V. Boychenko

Practical Evaluation of Optocouplers TID-Hardness Research Method Using an X-ray Unit

2019

S. V. Novikov
M. E. Cherniak
R.K. Mozhaev
Dmitry V. Boychenko

The article describes an optoisolators radiation hardness testing method to the effects of absorbed dose using an x-ray unit. Technological issues and features of the research are highlighted.

Keywords:

Radiation hardening
Optoelectronics
X-ray
Absorbed dose
Computer science
Linear particle accelerator
Electronic engineering
MOSFET
Light-emitting diode
Photodiode
research method

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