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State of the art and challenges for test and reliability of emerging nonvolatile resistive memories
State of the art and challenges for test and reliability of emerging nonvolatile resistive memories
2018
Elena Ioana Vatajelu
Peyman Pouyan
Said Hamdioui
Keywords:
Electronic engineering
Mathematics
Resistive random-access memory
Magnetoresistive random-access memory
Resistive touchscreen
Electrical engineering
fault modeling
Correction
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