The allowable spacing for lattice data sampling by a round stylus tip and an assessment of the envelope surface

Abstract This paper deals with surface waviness assessment by a commercial three-dimensional stylus instrument. To measure macroscopic waviness curve on an engineering surface, it was proposed to use a round stylus tip of relatively large radius. Developed in this paper, is a method to obtain the appropriate stylus tip radius in accordance with the sample surface texture and the corresponding discrete spacing for lattice data sampling. On condition that any two adjacent height data points are well-correlated, the statistical mean height and the overall deviation of the 3-D undulation summit height are also presented for a functional evaluation of waviness curves or envelope surface.