An X-ray photoemission electron microscope using electron mirror aberration corrector for the study of complex materials

Author(s): Feng, J.; Forest, E.; MacDowell, A.A.; Marcus, M.; Padmore, H.; Raoux, S.; Robin, D.; Scholl, A.; Schlueter, R.; Schmid, P.; Stohr, J.; Wan, W.; Wei, D.H.; Wu, Y.