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LEEM-PEEM study of surface defects surface potential and compositional inhomogeneities in InGaN-based heterostructures.
LEEM-PEEM study of surface defects surface potential and compositional inhomogeneities in InGaN-based heterostructures.
2014
Taisuke Ohta
Stephen R. Lee
Michael L. Smith
D. D. Koleske
Cristian B Diaconescu
Mary H. Crawford
Keywords:
Heterojunction
Optoelectronics
Molecular physics
Materials science
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