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Characterization and control of dislocations in 4H-SiC
Characterization and control of dislocations in 4H-SiC
2017
Hidekazu Tsuchida
Isaho Kamata
Ryohei Tanuma
Jason Paul Hadorn
Masahiro Nagano
Keywords:
Crystallography
Epitaxy
Dislocation
Materials science
Optoelectronics
Correction
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