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X-ray diffraction studies of trilayer oscillations in the preferred thickness of In films on Si(111)
X-ray diffraction studies of trilayer oscillations in the preferred thickness of In films on Si(111)
2013
Aaron Gray
Yang Liu
Hawoong Hong
T.-C. Chiang
Keywords:
Nuclear magnetic resonance
X-ray crystallography
Physics
Condensed matter physics
Quantum well
Oscillation
Correction
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