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奈米級金屬-氧化物-半導體場效電晶體閘極漏電流與等效長度鑑析
奈米級金屬-氧化物-半導體場效電晶體閘極漏電流與等效長度鑑析
2007
yejunjia
J. Gong
Chun Chia Yeh
Keywords:
Optoelectronics
Materials science
gate leakage current
Correction
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