Electroexcitation of 2+ and 4+ states in 28Si: A test of the renormalized shell model☆

Abstract The electromagnetic form factors of the lowest five 2 + and the lowest two 4 + states in 28 Si are measured via high-resolution electron scattering, some for the first time. Comparison with the renormalized shell model calculations of Chung and Wildenthal reveals deficiencies in the shell model description of these states.