Effect of Detector’s Noise in White Light Interferometry Based Quantitative Phase Microscopy

The detector’s noise is one of the limiting factor in obtaining high spatial phase sensitivity in phase microscopy systems. The influence of detector’s noise on the spatial phase sensitivity of white light interference microscopy system is studied experimentally while employing single chip CCD and three chip color CCD camera as an imaging sensor. It was found that 3 chip color-CCD camera provides high spatial phase sensitive QPI.