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High energy ion detection using 4H-SiC semiconductor detector
High energy ion detection using 4H-SiC semiconductor detector
2017
B. Zatko
P. Bohacek
M. Sekáčová
J Arbet
K. Hrubcin
Vladimir A. Skuratov
K. Sedlačková
V Necas
A. Sagatova
Keywords:
Optoelectronics
Particle detector
Spectroscopy
Semiconductor detector
Charged particle
Ion
Carbide
Measuring instrument
Alpha-particle spectroscopy
Materials science
Correction
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