Resonant magnetic X-ray scattering from ultrathin Ho–metal films down to a few atomic layers

Abstract The magnetic structure of ultrathin Ho–metal films grown on W(110) was studied by resonant magnetic X-ray scattering at the L 3 and M 5 resonances. For Ho films down to 14 monolayer (ML) thickness, a bulk-like helical antiferromagnetic structure is observed. For a 10-ML thick film, an altered magnetic structure and enhanced layer spacing is found.