Manufacturing system, manufacturing method, management device, management method, and a program

A manufacturing system for manufacturing an electronic device by a plurality of manufacturing steps, a plurality of manufacturing apparatuses for performing a process corresponding to a plurality of production processes include a production line for manufacturing an electronic device, a plurality of transistors under measurement met the production control unit for producing a wafer manufacturing line having a test circuit, and a measuring unit for measuring the respective electrical characteristics of a plurality of transistors under measurement included in the test circuit, a reference electrical characteristics predetermined not on the basis of the distribution on the wafer of the transistors under measurement, changing a specifying unit configured to specify a manufacturing process defect has occurred among the plurality of manufacturing processes, the setting of the manufacturing apparatus for performing a process corresponding to the failure occurred manufacturing process and a setting changing unit that.