Dielectric Properties of γ‐Iirradiated, Stretched, and Poled PVDF Thin Films

The effects of γ‐irradiation on the dielectric properties of stretched and poled polyvinylidene fluoride thin films synthesized by solvent cast method are reported. The films are subjected to γ‐irradiation with different doses (25, 50, and 75 kGy). XRD pattern is obtained to identify the presence of α/β phases. Dielectric constant and loss values of the stretched and poled films have been measured, before and after irradiation, and their nature of variation has been studied. β phase is retained even after the irradiation thereby confirming that the radiation damage is not significant. The dielectric loss is minimum in the frequency range 102 to104 Hz, giving the preferable frequency range of operation for devices