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Can we use scanned probe microscopy to measure local carrier mobility
Can we use scanned probe microscopy to measure local carrier mobility
2007
Showkat M. Yazdanian
Seppe Kuehn
Roger F. Loring
John A. Marohn
Keywords:
Scanning probe microscopy
Non-contact atomic force microscopy
Electron mobility
Field-effect transistor
Microscopy
Scanning capacitance microscopy
Charge density
Electric field
Nuclear magnetic resonance
Physics
Optoelectronics
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