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Impact of oxidation induced atomic disorder in narrow Si nanowires on transistor performance
Impact of oxidation induced atomic disorder in narrow Si nanowires on transistor performance
2011
Minari
Zushi
Watanabe
Kamakura
Uno
Mori
Keywords:
Strain (chemistry)
Logic gate
Silicon
Transistor
Nanowire
Optoelectronics
Materials science
Correction
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