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Measurement of Optical constants of SiC Wafers Using Far-infrared Lasers
Measurement of Optical constants of SiC Wafers Using Far-infrared Lasers
2017
K. Nakayama
S. Okajima
Tsuyoshi Akiyama
Kenji Tanaka
K. Kawahata
Keywords:
Refractive index
Far-infrared laser
Laser
Optoelectronics
Wafer
Far infrared
Optics
Materials science
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