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Microstructural Analysis and Transport Properties of RuO_2-Based, Thick Film Resistors
Microstructural Analysis and Transport Properties of RuO_2-Based, Thick Film Resistors
2008
S. Gabáni
K. Flachbart
V Pavlik
A Pietrikova
M. Gabániová
Keywords:
Condensed matter physics
Nuclear magnetic resonance
Physics
Resistor
Correction
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