Morphology of semicrystalline oxyethylene/oxybutylene block copolymer thin films on mica

Abstract The morphology of as-cast and annealed thin films of four symmetric semicrystalline block copolymers on mica was investigated by tapping mode atomic force microscopy (AFM) and grazing incidence X-ray diffraction (XRD). It is found that the morphology of the thin films is dependent on chain length of oxyethylene/oxybutylene block copolymers. The as-cast thin films of the shorter E m B n block copolymers on mica exhibit a multi-layered lamellar structure parallel to the surface, in which the stems of the E crystals in the first half polymer layer contacting mica are parallel to the mica surface and perpendicular to the mica surface in the upper polymer layers. In contrast, the as-cast thin film of longer E 224 B 114 exhibits a structure with mixed orientations of lamellar microdomains on a half polymer layer parallel to the surface. After annealing, the multi-layered structure on mica is transformed into a half-layered, densely branched structure, which is formed following a diffusion-limited aggregation mechanism, opposed to the featureless half-layered structure on silicon. Upon annealing, the upper polymer layers gradually retreat and the remaining area becomes thicker, but in contrast the first half polymer layer contacting mica becomes thinner due to wetting and the parallel orientation of the E crystal stems. The densely branched structure and the different chain orientations of the E crystal stems in the first half polymer layer contacting mica are attributed to the strong interaction between the E block and mica, as revealed by our previous work. The width of branches was employed to analyze the kinetics of secondary crystallization. It is also found that the width of the branches and the velocity of crystal front decrease as the chain length increases.