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Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]
Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]
2003
Sunil R. Das
Rochit Rajsuman
Keywords:
Design for testing
Test Management Approach
Computer engineering
Automatic test equipment
Real-time testing
Very-large-scale integration
Non-regression testing
Electronic engineering
Built-in self-test
Automatic test pattern generation
Engineering
special section
automatic testing
White-box testing
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