Total reflection X-ray fluorescence analysis of light elements using synchrotron radiation

Abstract Synchrotron radiation from SSRL (Stanford Synchrotron Radiation Laboratory) Beam Line III-4 was used as excitation source for Total Reflection X-ray Fluorescence Analysis (TXRF) of light elements ( Z E cut = 3 keV) for white beam measurements, and a double multilayer monochromator can be inserted. Detection limits of some hundred femtograms have been obtained for Mg with the white beam excitation. Boron could be detected with monochromatic excitation.