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AFM, Ellipsometrie, XPS und TEM an ultradünnen Oxid/Polymer Nanokomposit
AFM, Ellipsometrie, XPS und TEM an ultradünnen Oxid/Polymer Nanokomposit
2007
Alexander Fian
Barbara Stadelober
Georg Jakopic
Nadezda Matsko
Werner Grogger
Günther Leising
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