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Nanoelectrical probing with multiprobe SPM Systems compatible with scanning electron microscopes
Nanoelectrical probing with multiprobe SPM Systems compatible with scanning electron microscopes
2011
Aaron Lewis
Andrey Ignatov
Hesham Taha
Oleg Zhinoviev
Anatoly Komissar
Alexander Krol
David Lewis
Keywords:
Scanning electron microscope
Scanning probe microscopy
Scanning confocal electron microscopy
Scanning transmission electron microscopy
Analytical chemistry
Scanning capacitance microscopy
Optics
Nanowire
Atomic force microscopy
Materials science
Nanotechnology
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