Connectors, and a semiconductor testing device provided with a connector

A connector includes a first terminal. The first terminal includes a movable portion, and the movable portion has, on its tip side, a contact portion located on a course C of a case assembly. Further, the first terminal includes a fixed portion restricted from moving and located on a base side of the movable portion. The movable portion is elastically deformable to incline toward a side surface of an insertion hole while using the fixed portion as a fixed point. Further, the movable portion includes a hit portion between the contact portion and the fixed portion. The hit portion is located apart from the side surface of the insertion hole, and the hit portion is provided capable of hitting, midway during inclining of the movable portion toward the side surface of the insertion hole, against the side surface of the insertion hole.