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7ns 4Mb BICMOS SRAM With Parallel Testing Circuit
7ns 4Mb BICMOS SRAM With Parallel Testing Circuit
1991
Yoshinori Okajima
Y. Sato
K. Kurosaki
S. Yamada
Keywords:
Decoding methods
Electronic engineering
Read-write memory
BiCMOS
Static random-access memory
Computer science
Voltage
Semiconductor memory
Computer hardware
cmos process
bicmos integrated circuits
random access memory
Electrical engineering
Correction
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