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Microwave Device Characterization Using a Widefield Diamond Microscope
Microwave Device Characterization Using a Widefield Diamond Microscope
2018
Andrew Horsley
Patrick Appel
Janik Wolters
J. Achard
Alexandre Tallaire
Patrick Maletinsky
Philipp Treutlein
Keywords:
Diamond
Microscope
Optoelectronics
Materials science
Microwave
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