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Analysis of soft errors for FinFET technology based on the multiple sensitive volume model using PHITS code
Analysis of soft errors for FinFET technology based on the multiple sensitive volume model using PHITS code
2017
Shin-ichiro Abe
Tatsuhiko Sato
Takashi Kato
Hideya Matsuyama
Keywords:
Radiation
Soft error
Electronic engineering
Physics
single event effect
Simulation
Correction
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