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Carrier transport and bias stress stability of IGZO TFT with heterojunction channel
Carrier transport and bias stress stability of IGZO TFT with heterojunction channel
2019
Mamoru Furuta
Syuhei Hamada
Ryunosuke Higashi
Daichi Koretomo
Keywords:
Heterojunction
Thin-film transistor
Communication channel
Optoelectronics
Materials science
bias stress
Correction
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