Wavelength dependencies of the Kerr rotation angle and ellipticity for the magneto‐optical recording media

Wavelength dependencies of the Kerr rotation angle, ellipticity, and reflectivity are measured for a Co/Pt sample and a series of Co/Pd samples with varying film thicknesses. The interference effects are analyzed by comparing the Kerr spectra of the various Co/Pd samples. The dielectric tensors are measured at 632.8 nm and the thickness dependencies of the Kerr rotation angle, ellipticity, and figure of merit are studied from the experimental and simulated results. The wavelength and thickness dependencies of the magneto‐optical properties are studied in order to achieve an understanding of the magneto‐optical interactions in the superlattice samples.