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Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography
Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography
2018
Samuel Záchej
Jana Havránková
Kristýna Rosíková
Rostislav Váňa
Miloslav Havelka
Keywords:
Analytical chemistry
Focused ion beam
Cryo-electron tomography
Materials science
Sample preparation
Nanotechnology
Correction
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