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Application of Atomic Force Microscopy on Sedimentary Rocks - Experiments for the Mission to Mars
Application of Atomic Force Microscopy on Sedimentary Rocks - Experiments for the Mission to Mars
2003
Wladyslaw Altermann
A. Kempe
Wolfgang M. Heckl
Keywords:
Optical microscope
Conductive atomic force microscopy
Atomic force microscopy
Magnetic force microscope
Sedimentary rock
Scanning capacitance microscopy
Mars Exploration Program
Analytical chemistry
Chemistry
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