Spectral Multi-peak Analysis Methodology for Eliminating Effects of NaI Temperature Drift

This paper presents a methodology of spectral multi-peak analysis for eliminating temperature drift effects of NaI scintillation gamma-ray detectors. Properties and cost of NaI make it an excellent choice for low energy (< 1-MeV) spectroscopic studies. However, the light output of NaI scintillators has high temperature dependence, and the common practice of selecting a region of interest (ROI) for the peak of study in the measured spectrum requires that NaI temperature drift be monitored and corrected, typically by gain control of the measurement electronics.