Substrate orientation dependent fine structure splitting of symmetric In(Ga)As/GaAs quantum dots

We present a comparative investigation of the fine structure splitting (FSS) from self-organized In(Ga)As quantum dots (QDs) grown on GaAs substrates with different lattice orientations. QDs grown on (111)B- and (112) oriented substrates are analyzed and compared to small QDs on commonly used (001) substrates. Mean values for the FSS as low as (5.6 ± 0.6) μeV are obtained for QDs on (111)B-GaAs, comparing favorably to the other two approaches ((11.8 ± 1.7) μeV for (112)-surfaces and (14.0 ± 2.2) μeV for (001)-surfaces). Single photon emission from (111)B QDs grown by droplet epitaxy is demonstrated via photon autocorrelation studies with a g(2)(0) value of 0.07.