Comparison in internal strain sensitivity between polariscopy and Raman scattering spectroscopy in a (110)‐oriented ZnTe single crystal

We present the experimental fact that, in a (110)-oriented ZnTe single crystal, polariscopy is highly sensitive to the internal strain, comparing with Raman scattering spectroscopy. We utilized X-ray topography and X-ray diffraction analysis to thoroughly investigate the crystal structure that is intimately associated with the internal strain. The two X-ray structure analyses clarified that the misalignment from the [110] direction is formed in some regions. We obtained the following main result: The polariscopic analysis detects the internal strain formed by the misalignment, whereas the Raman scattering measurement is insensitive to the internal strain. We, therefore, conclude that polariscopy has the strain-detection sensitivity higher than the Raman scattering spectroscopy. We have confirmed that the polariscopic analysis can detect the internal strain less than 0.5% in the ZnTe crystal. (© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)