An over-top tracking test system for electro-optical detection device

In this paper, an over-top tracking test system for electro-optical detection device is designed, which provides an overtop test environment for electro-optical detection device by using a two-dimensional motion turntable covering the target source of the infrared and visible light bands in a rolling and pitching shafting system. The electro-optical detection device for two-frame configuration provides over-top tracking[1] function and performance testing and verification conditions.