Comparing the resolution of magnetic force microscopes using the CAMST reference samples

A set of reference samples for comparing the results obtained with different magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with di¤erent thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very Þne stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using di¤erent laser powers. These samples have been imaged in six di¤erent laboratories employing both home-built and commercial magnetic force microscopes. The resolution obtained with these different microscopes, tips and measurement methods varies between 30 and 100 nm.