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利用透射光谱与X射线反射谱精确测量溶胶凝胶TiO 2 薄膜厚度和光学常数
利用透射光谱与X射线反射谱精确测量溶胶凝胶TiO 2 薄膜厚度和光学常数
2012
Hongbao Jia
sunjinghua
Yao Xu
wudong
Haibing Lu
Lianghong Yan
yuanxiaodong
Keywords:
Thin film
X-ray reflectivity
Optics
Materials science
Physics
Correction
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