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陰極界面からの水素移動によるゲート誘電体劣化の機構【Powered by NICT】
陰極界面からの水素移動によるゲート誘電体劣化の機構【Powered by NICT】
2017
Higashi Yusuke
Takaishi Riichiro
Kato Koichi
Suzuki Masamichi
Nakasaki Yasushi
Tomita Mitsuhiro
Mitani Yuichiro
Matsumoto Masuaki
Ogura Shohei
Fukutani Katsuyuki
Yamabe Kikuo
Keywords:
Engineering
Computer engineering
Electronic engineering
Reliability engineering
Systems engineering
Correction
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