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X-ray diffraction studies of GaN p-i-n structures for high power electronics
X-ray diffraction studies of GaN p-i-n structures for high power electronics
2020
Alexandra Zimmerman
Jiaheng He
GuanJie Cheng
Davide Del Gaudio
J. Occena
F. Naab
Mohsen Nami
Bingjun Li
Jung Han
Rachel S. Goldman
Keywords:
Optoelectronics
X-ray crystallography
high power electronics
Materials science
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