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(Invited) Recent Developments in ST-MRAM, Including Scaling
(Invited) Recent Developments in ST-MRAM, Including Scaling
2013
Eugene J. O'Sullivan
M. J. Gajek
J J Nowak
Stephen L. Brown
Michael C. Gaidis
Guohan Hu
J. Z. Sun
P. L. Trouilloud
David W. Abraham
R.P. Robertazzi
W. J. Gallagher
Daniel C. Worledge
Keywords:
Computer engineering
Magnetoresistive random-access memory
History
Environmental ethics
Scaling
Systems engineering
Correction
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