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Development of a metrology technique suitable for in situ measurement and corrective manufacturing of freeform optics
Development of a metrology technique suitable for in situ measurement and corrective manufacturing of freeform optics
2019
Dali R. Burada
Kamal K. Pant
Vinod Mishra
Mohamed Bichra
Gufran S. Khan
Stefan Sinzinger
Chandra Shakher
Keywords:
Metrology
Optics
Materials science
In situ
Computer science
Correction
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