Alpha Particle Induced Single Event Upsets in Bipolar Static ECL Cells

S. Voldman,L. Patrick

Alpha Particle Induced Single Event Upsets in Bipolar Static ECL Cells

1984

S. Voldman
L. Patrick

A complete study of a bipolar static cell was done to determine alpha particle soft error sensitivities using alpha particle and circuit simulations. The results are supported by experimental data.

Keywords:

Doping
Experimental data
Electronic engineering
Alpha particle
Voltage
Single event upset
Monte Carlo method
Physics
Soft error
error analysis

Correction
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