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Nanoscale Conductivity Measurements of Biased Silicon Nanowires with Infrared Near-Field Optical Microscopy
Nanoscale Conductivity Measurements of Biased Silicon Nanowires with Infrared Near-Field Optical Microscopy
2019
Clayton Casper
Earl Ritchie
David J. Hill
Taylor S. Teitsworth
Samuel Berweger
James F. Cahoon
Joanna M. Atkin
Keywords:
Optical microscope
Nanoscopic scale
Near and far field
Infrared
Conductivity
Nanowire
Optoelectronics
Materials science
Silicon
silicon nanowires
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