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Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory
Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory
2020
Carlos Beauchamp
Johanna E. Camara
Jennifer Carney
Steven J. Choquette
Kenneth D. Cole
Paul C. DeRose
David L. Duewer
Michael S. Epstein
Margaret C. Kline
Katrice A. Lippa
Enrico Lucon
Karen W. Phinney
Maria Polakoski
Antonio M. Possolo
Katherine E. Sharpless
John R. Sieber
Blaza Toman
Michael R. Winchester
Donald Windover
Keywords:
Systems engineering
Metrology
NIST
Engineering
Correction
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