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Using the X-pinch x-ray source to Cross Calibrate new X-ray films with DEF from 1 - 10 keV
Using the X-pinch x-ray source to Cross Calibrate new X-ray films with DEF from 1 - 10 keV
2004
Tatiana A. Shelkovenko
Katherine M. Chandler
Sergey A. Pikuz
M. D. Mitchell
Daniel A. Hammer
J. P. Knauer
David D. Meyerhofer
Bryan Carpenter
Keywords:
Calibration
X-ray
X-ray films
Spectral sensitivity
Pinch
Image resolution
Physics
Optics
Correction
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