Calibrated broadband electrical characterization of nanowires

We present a technique for broadband electrical characterization of nanowires up to 40 GHz. The technique relies on established on-wafer, microwave calibration methods as well as direct measurement of the capacitive coupling that is in parallel with the nano-wire admittance. GaN nanowire devices are used to demonstrate the measurement technique and their response is found to depend strongly on the quality of electrical contacts and the geometry of the nanowire network.